R.-J. Ubar: search on Z-Library

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1

Researching the “therapeutic relationship” in psychoanalysis, counselling psychology and psychotherapy—a qualitative inquiry

Clarkson, Petr[ubar]ska

Journal:

Counselling Psychology Quarterly

Year:

1996

Language:

english

File:

PDF, 1.24 MB

english, 1996

2

Fast identification of true critical paths in sequential circuits

Ubar, Raimund, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Jürimägi, Lembit

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1021 KB

english, 2018

3

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan

Journal:

Journal of Electronic Testing

Year:

2020

Language:

english

File:

PDF, 2.01 MB

english, 2020

4

Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement

M. Blyzniuk, I. Kazymyra, W. Kuzmicz, W.A. Pleskacz, J. Raik, R. Ubar

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 686 KB

english, 2001

5

Design error diagnosis in digital circuits with stuck-at fault model

A. Jutman, R. Ubar

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 361 KB

english, 2000

6

Combining functional and structural approaches in test generation for digital systems

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 368 KB

english, 1998

7

Textile Hand: A New Method for Textile Objective Evaluation

Strazdienė, E., Martiši[ubar]tė, G., Gutauskas, M., Papreckienė, L.

Journal:

Journal of the Textile Institute

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

8

FAULT EFFECT REASONING IN DIGITAL SYSTEMS BY TOPOLOGICAL VIEW ON LOWAND HIGH-LEVEL DECISION DIAGRAMS

Journal:

Вестник Томского государственного университета. Управление, вычислительная техника и информатика

Year:

2014

Language:

english

File:

PDF, 948 KB

english, 2014

9

[IEEE 2019 8th Mediterranean Conference on Embedded Computing (MECO) - Budva, Montenegro (2019.6.10-2019.6.14)] 2019 8th Mediterranean Conference on Embedded Computing (MECO) - Equivalent Transformations of Structurally Synthesized BDDs and Applications

Jurimagi, Lembit, Ubar, Raimund, Viies, Vladimir

Year:

2019

Language:

english

File:

PDF, 1.30 MB

english, 2019

10

Hierarchical test generation for combinational circuits with real defects coverage

T Cibáková, M Fischerová, E Gramatová, W Kuzmicz, W.A Pleskacz, J Raik, R Ubar

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 252 KB

english, 2002

11

Test synthesis with alternative graphs

Journal:

IEEE Design & Test of Computers

Year:

1996

Language:

english

File:

PDF, 1.37 MB

english, 1996

12

[IEEE Comput. Soc IEEE European Test Workshop - Cascais, Portugal (23-26 May 2000)] Proceedings IEEE European Test Workshop - Hierarchical defect-oriented fault simulation for digital circuits

Blyzniuk, M., Cibakova, T., Gramatova, E., Kuzmicz, W., Lobur, M., Pleskacz, W., Raik, J., Ubar, R.

Year:

2000

Language:

english

File:

PDF, 585 KB

english, 2000

13

[IEEE 2010 IEEE International Symposium on Multimedia (ISM) - Taichung, Taiwan (2010.12.13-2010.12.15)] 2010 IEEE International Symposium on Multimedia - Remote and Virtual Laboratories in Problem-Based Learning Scenarios

Wuttke, Heinz-Dietrich, Ubar, Raimund, Henke, Karsten

Year:

2010

Language:

english

File:

PDF, 578 KB

english, 2010

14

[IEEE Comput. Soc IEEE 2001 2nd International Symposium on Quality Electronic Design. IEEE ISQED 2001 - San Jose, CA, USA (26-28 March 2001)] Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design - Defect-oriented fault simulation and test generation in digital circuits

Kuzmicz, W., Pleskacz, W., Raik, J., Ubar, R.

Year:

2001

Language:

english

File:

PDF, 682 KB

english, 2001

15

[IEEE 2009 EAEEIE Annual Conference - Valencia, Spain (2009.06.22-2009.06.24)] 2009 EAEEIE Annual Conference - Teaching research in the laboratory using diagnosis environment for digital systems

Kostin, Sergei, Ubar, Raimund, Raik, Jaan, Aarna, Margit, Brik, Marina, Wuttke, H.-D.

Year:

2009

Language:

english

File:

PDF, 321 KB

english, 2009

16

Improvement of Mechanical Properties of Unsaturated Polyesters by Acrylonitrile

G[ubar]nd[ubar]z, G[ubar]ng[obar]r, Deniz, Adnan

Journal:

Polymer-Plastics Technology and Engineering

Year:

1992

Language:

english

File:

PDF, 277 KB

english, 1992

17

[Presses Polytech. Univ. Romandes ISCAS 2000 Geneva. 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings - Geneva, Switzerland (28-31 May 2000)] 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) - Back-tracing and event-driven techniques in high-level simulation with decision diagrams

Ubar, R., Raik, J., Morawiec, A.

Year:

2000

Language:

english

File:

PDF, 429 KB

english, 2000

18

[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Fault collapsing with linear complexity in digital circuits

Ubar, R., Mironov, D., Raik, J., Jutman, A.

Year:

2010

Language:

english

File:

PDF, 286 KB

english, 2010

19

[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Combinational fault simulation in sequential circuits

Ubar, Raimund, Kousaar, Jaak, Gorev, Maksim, Devadze, Sergei

Year:

2015

Language:

english

File:

PDF, 413 KB

english, 2015

20

Decider: a system for hierarchical test pattern generation

JAAN RAIK,RAIMUND UBAR

Journal:

Радиоэлектроника и информатика

Year:

2003

Language:

english

File:

PDF, 1.12 MB

english, 2003

21

Hierarchical approaches to test generation and fault simulation

Journal:

Радиоэлектроника и информатика

Year:

2003

Language:

english

File:

PDF, 112 KB

english, 2003

22

Research in Digital Design and Test at Tallinn University of Technology

Raimund Ubar,Gert Jervan,Artur Jutman

Journal:

Радиоэлектроника и информатика

Year:

2008

Language:

english

File:

PDF, 587 KB

english, 2008

23

SSBDDs and Double Topology for Multiple Fault Reasoning

Raimund Ubar,Sergei Kostin,Jaan Raik

Journal:

Радиоэлектроника и информатика

Year:

2013

Language:

english

File:

PDF, 202 KB

english, 2013

24

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation

Oyeniran, Adeboye Stephen, Azad, Siavoosh Payandeh, Ubar, Raimund

Year:

2018

Language:

english

File:

PDF, 1.35 MB

english, 2018

25

[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - Mixed-level identification of fault redundancy in microprocessors

Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Gursoy, Cemil Cem, Raik, Jaan

Year:

2019

Language:

english

File:

PDF, 330 KB

english, 2019

26

[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits

Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye Stephen

Year:

2019

File:

PDF, 302 KB

2019

27

[IEEE 2019 Sixth Indian Control Conference (ICC) - Hyderabad, India (2019.12.18-2019.12.20)] 2019 Sixth Indian Control Conference (ICC) - Energy-efficient Nonlinear Model Predictive Control of BLDC Motor in Electric Vehicles

Ubare, Pramod, Ingole, Deepak, Sonawane, Dayaram

Year:

2019

File:

PDF, 1.65 MB

2019

28

Embedded fault diagnosis in digital systems with BIST

Raimund Ubar, Sergei Kostin, Jaan Raik

Journal:

Microprocessors and Microsystems

Year:

2008

Language:

english

File:

PDF, 476 KB

english, 2008

29

Hybrid BIST optimization using reseeding and test set compaction

Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar

Journal:

Microprocessors and Microsystems

Year:

2008

Language:

english

File:

PDF, 503 KB

english, 2008

30

Boundary-scan test: H. Bleeker, P. Van Den Eijnden and F. De Jong. Kluwer Academic, Boston, MA (1993). 225 pp., Dfl 137.75, £50.75, ISBN 0-7923-9296-5

Journal:

Engineering Applications of Artificial Intelligence

Year:

1994

Language:

english

File:

PDF, 225 KB

english, 1994

31

Mixed hierarchical-functional fault models for targeting sequential cores

Jaan Raik, Raimund Ubar, Taavi Viilukas, Maksim Jenihhin

Journal:

Journal of Systems Architecture

Year:

2008

Language:

english

File:

PDF, 469 KB

english, 2008

32

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphs

A. Yu. Matrosova, A. G. Pleshkov, R. R. Ubar

Journal:

Automation and Remote Control

Year:

2005

Language:

english

File:

PDF, 310 KB

english, 2005

33

A New Testability Calculation Method to Guide RTL Test Generation

Jaan Raik, Tanel Nõmmeots, Raimund Ubar

Journal:

Journal of Electronic Testing

Year:

2005

Language:

english

File:

PDF, 543 KB

english, 2005

34

PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams

Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar

Journal:

Journal of Electronic Testing

Year:

2009

Language:

english

File:

PDF, 505 KB

english, 2009

35

Test Time Minimization for Hybrid BIST of Core-Based Systems

Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin

Journal:

Journal of Computer Science and Technology

Year:

2006

File:

PDF, 411 KB

2006

36

Dynamic analysis of digital circuits with multi-valued simulation

Journal:

Microelectronics Journal

Year:

1998

Language:

english

File:

PDF, 488 KB

english, 1998

37

Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations

Jaan Raik, Raimund Ubar

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 144 KB

english, 2000

38

Design Error Diagnosis with Re-Synthesis in Combinational Circuits

Journal:

Journal of Electronic Testing

Year:

2003

Language:

english

File:

PDF, 153 KB

english, 2003

39

Hybrid BIST energy minimisation technique for system-on-chip testing

Jervan, G., Peng, Z., Shchenova, T., Ubar, R.

Journal:

IEE Proceedings - Computers and Digital Techniques

Year:

2006

Language:

english

File:

PDF, 459 KB

english, 2006

40

FPGA-based fault emulation of synchronous sequential circuits

P. Ellervee, J. Raik, K. Tammemae, R.-J. Ubar

Journal:

IET Computers & Digital Techniques

Year:

2007

Language:

english

File:

PDF, 288 KB

english, 2007

41

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols

Bengtsson, T., Kumar, S., Ubar, R.-J., Jutman, A., Peng, Z.

Journal:

IET Computers & Digital Techniques

Year:

2008

Language:

english

File:

PDF, 370 KB

english, 2008

42

Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips

Raik, J., Govind, V., Ubar, R.

Journal:

IET Computers & Digital Techniques

Year:

2009

Language:

english

File:

PDF, 411 KB

english, 2009

43

[IEEE 2008 International Biennial Baltic Electronics Conference (BEC2008) - Tallinn (2008.10.6-2008.10.8)] 2008 11th International Biennial Baltic Electronics Conference - A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits

Petlenkov, E., Jutman, A., Nomm, S., Ubar, R.

Year:

2008

Language:

english

File:

PDF, 106 KB

english, 2008

44

[IEEE 2007 37th annual frontiers in education conference - global engineering: knowledge without borders, opportunities without passports - Milwaukee, WI, USA (2007.10.10-2007.10.13)] 2007 37th annual frontiers in education conference - global engineering: knowledge without borders, opportunities without passports - BIST analyzer: A training platform for SoC testing

Juttnan, A., Tsertov, A., Tsepurov, A., Aleksejev, I., Ubar, R., Wuttke, H.-D.

Year:

2007

Language:

english

File:

PDF, 904 KB

english, 2007

45

[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Calculation of LFSR Seed and Polynomial Pair for BIST Applications

Jutman, A., Tsertov, A., Ubar, R.

Year:

2008

Language:

english

File:

PDF, 2.63 MB

english, 2008

46

On the Reuse of TLM Mutation Analysis at RTL

Valerio Guarnieri, Giuseppe Di Guglielmo, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 661 KB

english, 2012

47

Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints

Taavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 555 KB

english, 2012

48

[IEEE 2012 13th Biennial Baltic Electronics Conference (BEC2012) - Tallinn, Estonia (2012.10.3-2012.10.5)] 2012 13th Biennial Baltic Electronics Conference - A benchmark suite for evaluating the efficiency of test tools

Kruus, H., Ubar, R., Ellervee, P., Gorev, M., Pesonen, V., Devadze, S., Orasson, E., Brik, M., Min, M., Annus, P., Kruus, M., Meigas, K.

Year:

2012

Language:

english

File:

PDF, 364 KB

english, 2012

49

[IEEE Comput. Soc 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Boston, MA, USA (3-5 Nov. 2003)] Proceedings. 16th IEEE Symposium on Computer Arithmetic - Hybrid BIST time minimization for core-based systems with STUMPS architecture

Jervan, G., Eles, P., Peng, Z., Ubar, R., Jenihhin, M.

Year:

2003

Language:

english

File:

PDF, 233 KB

english, 2003

50

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - An External Test Approach for Network-on-a-Chip Switches

Raik, Jaan, Govind, Vineeth, Ubar, Raimund

Year:

2006

Language:

english

File:

PDF, 223 KB

english, 2006

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